作者：

作者单位：

刊名：The Refractories Engineer

ISSN：1362-4547

出版年：2011-01-05

卷：

期：1

起页：8

止页：8

分类号：TQ175.7

语种：英文

关键词：

内容简介

CERAM, a global expert in materials testing, analysis and consultancy, has extended the scope of its microstructural and mineralogical analysis services with the acquisition of a new X-Ray Diffractometer (XRD). The state-of-the-art XRD system provides faster analysis turnaround, increased resolution, non-powder sample analysis and improved Rietveld refinement, as well as three new techniques: X-Ray Reflectivity (XRR); Grazing Incidence XRD (GIXRD); and Micro-Diffraction (m-XRD).